(Peer-Reviewed) Influence of aspect ratio and arrangement direction on the shear behavior of ellipsoids
Weichen Sun ¹, Kai Wu 吴恺 ², Songyu Liu 刘松玉 ², Xiang Zhang 张翔 ²
¹ School of Civil Engineering, Chongqing University, Chongqing 400045, China
中国 重庆 重庆大学土木工程学院
² School of Transportation, Southeast University, Nanjing 210096, China
中国 南京 东南大学交通学院
Abstract
This work studies the macroscopic and microscopic behaviors of ellipsoids under triaxial tests using 3D discrete element method (DEM) simulation. To avoid the boundary effect, a novel stress servo-controlled periodic boundary condition is proposed to maintain the confining pressure of samples during testing. The shape features of ellipsoids are investigated, including the aspect ratio of elongated/oblate ellipsoids and the initial arrangement directions of ellipsoids.
The macroscopic properties of ellipsoidal particle samples, such as the deviatoric stress, volumetric strain, internal friction angle, as well as dilatancy angles are explored. Elongated and oblate ellipsoids with varying aspect ratios are investigated for the occurrence of stick-slips. In addition, it is demonstrated that the initial arrangement direction has a significant impact on the coordination number and contact force chains. The corresponding anisotropy coefficients of the entire contact network are analyzed to probe the microscopic roots of macroscopic behavior.
Flicker minimization in power-saving displays enabled by measurement of difference in flexoelectric coefficients and displacement-current in positive dielectric anisotropy liquid crystals
Junho Jung, HaYoung Jung, GyuRi Choi, HanByeol Park, Sun-Mi Park, Ki-Sun Kwon, Heui-Seok Jin, Dong-Jin Lee, Hoon Jeong, JeongKi Park, Byeong Koo Kim, Seung Hee Lee, MinSu Kim
Opto-Electronic Advances
2025-09-25
Dual-frequency angular-multiplexed fringe projection profilometry with deep learning: breaking hardware limits for ultra-high-speed 3D imaging
Wenwu Chen, Yifan Liu, Shijie Feng, Wei Yin, Jiaming Qian, Yixuan Li, Hang Zhang, Maciej Trusiak, Malgorzata Kujawinska, Qian Chen, Chao Zuo
Opto-Electronic Advances
2025-09-25