(Peer-Reviewed) Twin evolution in cast Mg-Gd-Y alloys and its dependence on aging heat treatment
Jingli Li ¹, Zhaohui Dong ¹, Xin Yi 易新 ¹, Di Wu 吴迪 ², Rongshi Chen 陈荣石 ²
¹ Department of Mechanics and Engineering Science, College of Engineering, Peking University, Beijing 100871, China
中国 北京 北京大学工学院力学与工程科学系
² Shi-Changxu Innovation Center for Advanced Materials, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China
中国 沈阳 中国科学院金属研究所师昌绪先进材料创新中心
Abstract
Effects of rare-earth (RE) and precipitates on twin evolution in cast Mg-10Gd-3Y-0.5Zr (wt.%) (GW103) alloys of solid solution (T4) and aged (T6) states are investigated performing quasi-static room temperature compression tests and microstructural characterization. It is found that both {10–12} and {11–21} extension twins (ET1 and ET2) can appear in the T4 and T6 states but with different emergence sequences.
As the aging heat treatment leads to consumption of RE solutes which could inhibit atomic shuffling required for nucleation of ET1 but not ET2, ET2 occurs prior to ET1 in the T4 state, and ET1 emerges before ET2 in the T6 state. The extension twins here mainly coordinate the plastic deformation through the non-Schmid effect. Our results shed light on the influence of RE elements on twin evolution in magnesium alloys and have implications in developing high-performance Mg-RE alloys.
Flicker minimization in power-saving displays enabled by measurement of difference in flexoelectric coefficients and displacement-current in positive dielectric anisotropy liquid crystals
Junho Jung, HaYoung Jung, GyuRi Choi, HanByeol Park, Sun-Mi Park, Ki-Sun Kwon, Heui-Seok Jin, Dong-Jin Lee, Hoon Jeong, JeongKi Park, Byeong Koo Kim, Seung Hee Lee, MinSu Kim
Opto-Electronic Advances
2025-09-25
Dual-frequency angular-multiplexed fringe projection profilometry with deep learning: breaking hardware limits for ultra-high-speed 3D imaging
Wenwu Chen, Yifan Liu, Shijie Feng, Wei Yin, Jiaming Qian, Yixuan Li, Hang Zhang, Maciej Trusiak, Malgorzata Kujawinska, Qian Chen, Chao Zuo
Opto-Electronic Advances
2025-09-25
