(Peer-Reviewed) Deep learning enabled single-shot absolute phase recovery in high-speed composite fringe pattern profilometry of separated objects
Maciej Trusiak, Malgorzata Kujawinska
Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 Sw. A. Boboli Street, Warsaw 02-525, Poland
Opto-Electronic Advances, 2023-12-12
Abstract
A recent article in the Opto-Electronic Advances (OEA) journal from Prof. Qian Chen and Prof. Chao Zuo’s group introduced a new and efficient 3D imaging system that captures high-speed images using deep learning-enabled fringe projection profilometry (FPP).
In this News & Views article, we explore potential avenues for future advancements, including expanding the measurement range through an extended number-theoretical approach, enhancing quality through the incorporation of horizontal fringes, and integrating data from other modalities to broaden the system's applications.
Multiplexed stimulated emission depletion nanoscopy (mSTED) for 5-color live-cell long-term imaging of organelle interactome
Yuran Huang, Zhimin Zhang, Wenli Tao, Yunfei Wei, Liang Xu, Wenwen Gong, Jiaqiang Zhou, Liangcai Cao, Yong Liu, Yubing Han, Cuifang Kuang, Xu Liu
Opto-Electronic Advances
2024-07-05